| Principles, methods and
algorithms of testing and diagnosis of faults of electronic devices and
components. Depth, coverage and cost of the test. Functionality of
modern test equipment, speed and accuracy. Test fixtures. Contactless
testing (e.g. AOI, XOI). Diagnostics of analog, digital and mixed
circuits. Decomposition of circuits, test optimisation. Automated test
equipment (ATE). Test in production, design for testability.Test types.
testsignals and vectors, test criterias. Automated generation of test
vectors. Test of embedded systems. |